[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

Engineers are beginning to appreciate that, from prototypes early in the design cycle through to final system test, a digital pattern generator (DPG) speeds up system debug and therefore shortens the ...

Eight New Models Offer Biggest Display Size, Deepest Memory and the Only Pattern Generation Available in a Fixed Configuration PALO ALTO, Calif.—Agilent Technologies Inc. expands its industry-leading ...

The picture on a TV set used to be the combined product of multiple analog systems, and since TVs had no internal diagnostics, the only way to know things were adjusted properly was to see for ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...