Semiconductor companies have come to rely on delay testing to attain high defect coverage of manufactured digital ICs. Delay testing uses TD (transition delay) patterns created by ATPG (automatic test ...

The effectiveness of semiconductor manufacturing test directly impacts the quality and reliability of shipped silicon and the economical efficiency of overall test costs within the supply chain.

Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...

Magnetic flux leakage (MFL) testing is a widely established non‐destructive evaluation technique used to assess the integrity of ferromagnetic materials in applications such as pipeline inspection and ...

As the semiconductor world excitingly explores the potential of new advanced package solutions for their intricate and novel designs, challenges arise from undetected defects caused by the complexity ...

There is a great deal of activity in wide bandgap (WBG) power electronics lately, with Gallium Nitride (GaN) and Silicon Carbide (SiC) devices getting a lot of attention due to the technologies’ ...